CD
Cem M. Deniz

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Intellectual property

Patents

Patent work with collaborators at NYU has focused on MRI safety, specific absorption rate (SAR), and methods for managing radiofrequency power.

Granted patent United States · 2019

System, method and computer-accessible medium for determining specific absorption rate obtained based on magnetic resonance imaging and temperature property measurements

Patent number
US 10,180,362 B2
Inventors
Leeor Alon, Cem Murat Deniz, Gene Young Cho, and Leslie F. Greengard
Assignee
New York University
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Published application · abandoned United States · 2020

System, method and computer-accessible medium for compliance assessment and active power management for safe use of radiowave-emitting devices

Publication number
US 2020/0076064 A1
Inventors
Leeor Alon, Cem Murat Deniz, Christopher M. Collins, and Daniel K. Sodickson
Assignee
New York University
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Patent titles, inventor lists, assignee, and current application status are transcribed from the linked public patent records. The second record is a published application and is not listed as a granted patent.